Resolution (or resolving power) is a measure of the clarity of an image; it is the ability to distinguish between two points that are very close together.
Higher resolution means the microscope can distinguish between points that are closer together (smaller minimum distance).
Resolving Power (minimum resolvable distance):
Naked Eye: 0.1 mm
Light Microscope:200 nm (0.2 μm)
Electron Microscope:0.2 nm
Increasing magnification does not increase resolution. Beyond a certain point, further magnification only produces a blurry image — this is called empty magnification.
An electron microscope uses a beam of accelerated electrons as its source of illumination, allowing for significantly higher resolution and magnification than a light microscope.
Working Principle:
An electron gun produces a beam of electrons.
Electromagnetic lenses (condenser lenses) focus the electron beam onto the specimen.
The specimen must be an extremely thin section (20–100 nm).
As the beam passes through, denser regions of the specimen scatter more electrons than lighter regions.
The scattered electron pattern passes through an objective lens and then an ocular lens to create a highly magnified image on a fluorescent screen.
Fig.1.5 Working principle of electron microscope
Magnification: Can magnify specimens from 1 to 50 million times.
Resolution: Has a resolving power of 0.2 nm — approximately 1000× better than a light microscope.
Transmission Electron Microscope (TEM): Electrons pass through an ultra-thin section of the specimen. Used to study the internal ultrastructure of cells and organelles.
Scanning Electron Microscope (SEM): Electrons are scanned across the surface of the specimen. Used to study the surface architecture (3D topography) of a specimen.